Books

AGUIAR, Y. Q., et al., Single-Event Effects, from Space to Accelerator Environments: Analysis, Prediction and Hardening by Design, Springer Nature, 2024. DOI: 10.1007/978-3-031-71723-9

Journals

26) HASAN, A., AGUIAR, Y. Q., ALÍA, R. G., et al., Online and offline Radiation-Induced Attenuation measurements on FD-7 radiophotoluminescence dosimeters irradiated at high X-ray doses, Radiation Measurements, Elsevier, 2024. DOI: 10.1016/j.radmeas.2024.107246

25) SLIPUKHIN, I., CORONETTI, A., ALÍA, R. G., et al., Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring, IEEE Transactions on Nuclear Science, 2024. DOI: 10.1109/TNS.2024.3424201

24) MARQUES, C., WROBEL, F., AGUIAR, Y. Q., et al., Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells, MDPI Electronics, 2024. DOI: 10.3390/electronics13101954

23) MARQUES, C., WROBEL, F., AGUIAR, Y. Q., et al., A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons , MDPI Eng, 2024. DOI: 10.3390/eng5010017

22) FERRARI, M., AGUIAR, Y. Q., HASAN, A. et al., Characterization of Radiophotoluminescence Dosimeters Under X-Ray Irradiation at High Doses, IEEE Transactions on Nuclear Science, 2024. DOI: 10.1109/TNS.2024.3365272

21) BILKO, K., ALÍA, R. G., BARBERO, M. S., GIRARD, S., AGUIAR, Y. Q., et al., Mixed-Field Radiation Monitoring and Beam Characterization Through Silicon Diode Detectors, IEEE Transactions on Nuclear Science, 2024. DOI: 10.1109/TNS.2024.3350342

20) BARBERO, M. S., SLIPUKHIN, I., CECCHETTO, M., PRELIPCEAN, D., AGUIAR, Y. Q., et al., Characterization of Fragmented Ultrahigh-Energy Heavy Ion Beam and Its Effects on Electronics Single-Event Effect Testing, IEEE Transactions on Nuclear Science, 2024. DOI: 10.1109/TNS.2024.3396737

19) BILKO, K., ALÍA, R. G., AGUIAR, Y. Q., et al., Radiation Environment in the Large Hadron Collider During the 2022 Restart and Related RHA Implications, IEEE Transactions on Nuclear Science, 2023. DOI: 10.1109/TNS.2023.3328145

18) BILKO, K., ALÍA, R. G., DI FRANCESCA, D., AGUIAR, Y. Q., et al., CERN Super Proton Synchrotron radiation environment and related Radiation Hardness Assurance implications, IEEE Transactions on Nuclear Science, 2023. DOI: 10.1109/TNS.2023.3261181

17) LERNER, G., PELISSOU, P., AGUIAR, Y. Q., BARBERO, M. S., et al., Analysis of the radiation field generated by 200-MeV electrons on a target at the CLEAR accelerator at CERN, IEEE Transactions on Nuclear Science, 2023. DOI: 10.1109/TNS.2023.3252808

16) CECCHETTO, M., BARBERO, M. S., LERNER, G., ALÍA, R. G., AGUIAR, Y. Q., et al., Electronics Irradiation with Neutrons at the NEAR Station of the n_TOF Spallation Source at CERN, IEEE Transactions on Nuclear Science, 2023. DOI: 10.1109/TNS.2023.3242460

15) WROBEL, F., AGUIAR, Y. Q., et al., An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons, Electronics, 2023. DOI: 10.3390/electronics12010104

14) FERRARI, M., SENAJOVA, D., ABERLE, O., AGUIAR, Y. Q., et al., Design development and implementation of an irradiation station at the neutron time-of-flight facility at CERN, Physical Review Accelerators and Beams, 2022. DOI: 10.1103/PhysRevAccelBeams.25.103001

13) PRAMBERGER, D., AGUIAR, Y. Q., TRUMMER, J., VINCKE, H., Characterisation of Radio-Photo-Luminescence (RPL) dosimeters as radiation monitors in the CERN accelerator complex, IEEE Transactions on Nuclear Science, 2022. DOI: 10.1109/TNS.2022.3174784

12) GUAGLIARDO, S., WROBEL, F., AGUIAR, Y. Q., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., POUGET, V., TOUBOUL, A. D., Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge, Microelectronics Reliability, Elsevier B.V., 2021. DOI: 10.1016/j.microrel.2021.114087

11) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., POUGET, V., TOUBOUL, A. D., Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications, Microelectronics Reliability, Elsevier B.V., 2020. DOI: 10.1016/j.microrel.2020.113877

10) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., POUGET, V., TOUBOUL, A. D., Reliability-driven pin assignment optimization to improve in-orbit soft-error rate, Microelectronics Reliability, Elsevier B.V., 2020. DOI: 10.1016/j.microrel.2020.113885

9) SCHVITTZ, R.B., AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., ROSA, L.S., BUTZEN, P.F., Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation, Microelectronics Reliability, Elsevier B.V., 2020. DOI: 10.1016/j.microrel.2020.113871

8) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., KASTENSMIDT, F., LEROUX, P., SAIGNÉ, F., POUGET, V., TOUBOUL, A. D., Exploiting Transistor Folding Layout as RHBD Technique against Single-Event Transients, IEEE Transactions on Nuclear Science, 2020. DOI: 10.1109/TNS.2020.3003166

7) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., POUGET, V., TOUBOUL, A. D., Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions, Aerospace, 2020. DOI: 10.3390/aerospace7020012

6) AGUIAR, Y. Q., WROBEL, F., GUAGLIARDO, S., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., TOUBOUL, A. D., POUGET, V., Radiation Hardening Efficiency of Gate Sizing and Transistor Stacking based on Standard Cells, Microelectronics Reliability, Elsevier B.V., 2019. DOI: 10.1016/j.microrel.2019.113457

5) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., TOUBOUL, A. D., POUGET, V., Impact of Complex-Logic Cell Layout on the Single-Event Transient Sensitivity, IEEE Transactions on Nuclear Science, 2019. DOI: 10.1109/TNS.2019.2918077

4) AGUIAR, Y. Q., WROBEL, F., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., TOUBOUL, A. D., POUGET, V., Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions, Microelectronics Reliability, Volume 88-90, September 2018, Pages 920-924, Elsevier B.V., 2018. DOI: 10.1016/j.microrel.2018.07.018

3) AGUIAR, Y. Q., ARTOLA, L., HUBERT, G., MEINHARDT, C., KASTENSMIDT, F. L., REIS, R., Evaluation of Radiation-Induced Soft Error in Majority Voters designed in 7nm FinFET Technology, Microelectronics Reliability, Volume 76-77, September 2017, Pages 660-664, Elsevier B.V., 2017. DOI: 10.1016/j.microrel.2017.06.077

2) CALIENES, W. B., AGUIAR, Y. Q., MEINHARDT, C., VLADMIRESCU, A., REIS, R., Evaluation of Heavy-Ion Impact in Bulk and FDSOI devices under ZTC condition, Microelectronics Reliability, Volume 76-77, September 2017, Pages 655-659, Elsevier B.V., 2017. DOI: 10.1016/j.microrel.2017.06.063

1) AGUIAR, Y. Q., ZIMPECK, A., MEINHARDT, C., REIS, R., Permanent and single event transient faults reliability evaluation EDA tool, Microelectronics Reliability, Volume 64, September 2016, Pages 63–67, Elsevier B.V., 2016. DOI: 10.1016/j.microrel.2016.07.072

Conference Proceedings

20) FERRARI, M.; AGUIAR, Y. Q.; , MORANA, A.; HASAN, A.; CAMPANELLA, C.; ALIA, R. G.; On-line attenuation measurements of RPL dosimeters irradiated with X-Ray sources for high-dose applications. SSD-20 20th International Conference on Solid State Dosimetry, Sep 2023, Viareggio, Italy.

19) AGUIAR, Y. Q.; LERNER, G.; CECCHETTO, M.; ALIA, R. G.; BILKO, K.; ZIMMARO, A.; BRUCOLI, M.; DANZECA, S.; LADZINSKI, T.; APOLLONIO, A.; POTOINE, J. B. ; Implications and Mitigation of Radiation Effects on the CERN SPS Operation during 2021. 13th International Particle Accelerator Conference, 2022.

18) AGUIAR, Y. Q.; LERNER, G.; ALIA, R. G.; PRELIPCEAN, D.; APOLLONIO, A.; CERUTTI, F.; DANZECA, S.; GILARTE, M. S.; Radiation to Electronics Impact on CERN LHC Operation: Run 2 Overview and HL-LHC Outlook. 12th International Particle Accelerator Conference, 2021.

17) GUAGLIARDO, S., WROBEL, F., AGUIAR, Y. Q., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., TOUBOUL, A. D., POUGET, V., Effect of Temperature on Single Event Latchup Sensitivity, Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Conference, 2020, Marrakech.

16) GUAGLIARDO, S., WROBEL, F., AGUIAR, Y. Q., AUTRAN, J-L., LEROUX, P., SAIGNÉ, F., TOUBOUL, A. D., POUGET, V., Single Event Latchup Cross Section Calculation from TCAD Simulations – Effect of the Doping Profiles and Anode to Cathode Spacing, Radiation Effects on Components and Systems (RADECS) Conference, 2019, Montpellier.

15) AGUIAR, Y. Q., KASTENSMIDT, F. L., MEINHARDT, C., ARTOLA, L., HUBERT, G., REIS, R., Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR circuits, Radiation Effects on Components and Systems (RADECS) Conference, 2017, Geneva. DOI: 10.1109/RADECS.2017.8696238

14) AGUIAR, Y. Q., MEINHARDT, C., REIS, R., Radiation Sensitivity of XOR topologies in multigate technologies under voltage variability, IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 2017, Bariloche. DOI: 10.1109/LASCAS.2017.7948075

13) AGUIAR, Y. Q., KASTENSMIDT, F. L., MEINHARDT, C., REIS, R., SET response of FinFET-based majority voter circuits under work-function fluctuation, IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2017, Batumi, Pages 282–285. DOI: 10.1109/ICECS.2017.8292064

12) AGUIAR, Y. Q., ZIMPECK, A. L., MEINHARDT, C., REIS, R., Temperature Dependence and ZTC Bias Point Evaluation of sub 20nm Bulk Multigate Devices, IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2017, Batumi, Pages 9–12. DOI: 10.1109/ICECS.2017.8291999

11) ZIMPECK, A. L., AGUIAR, Y. Q., MEINHARDT, C., REIS, R., Robustness of Sub-22nm Multigate Devices Against Physical Variability, IEEE International Symposium on Circuits and Systems (ISCAS), 2017, Baltimore. DOI: 10.1109/ISCAS.2017.8050441

10) BRENDLER, L. H., FARIAS, C., ZIMPECK, A. L., AGUIAR, Y. Q., MEINHARDT, C., REIS, R., Projeto de Portas Lógicas XOR com Redução de Potência por Voltage Scaling, XXIII Iberchip Workshop, 2017, Bariloche.

9) SILVA, P., ZIMPECK, A. L., AGUIAR, Y. Q., REIS, R., Impacto da Variabilidade PVT em Somadores na Tecnologia FinFET, XXIII Iberchip Workshop, 2017, Bariloche.

8) SILVA, P., ZIMPECK, A. L., AGUIAR, Y. Q., REIS, R., Environmental Variability Impact in FinFET Full-adders, SForum, 2017, Fortaleza.

7) AGUIAR, Y. Q., ZIMPECK, A. L., MEINHARDT, C., NFAS-tool: avaliação da confiabilidade de células combinacionais sob falhas de radiação do tipo SET, XXII Iberchip Workshop, 2016, Florianópolis.

6) AGUIAR, Y. Q., ZIMPECK, A. L., MEINHARDT, C., Reliability Evaluation of Combinational Circuits from a Standard Cell Library, 31st South Symposium on Microelectronics (SIM), 2016, Porto Alegre.

5) ZIMPECK, A. L., AGUIAR, Y. Q., MEINHARDT, C., REIS, R., Geometric variability impact on 7nm Trigate combinational cells, IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2016, Monte Carlo, Pages 9–12. DOI: 10.1109/ICECS.2016.7841119

4) AGUIAR, Y. Q., et al., Encontro com os docentes: a importância da interação do corpo docente com o Programa de Educação Tutorial, XVIII SULPET Encontro dos grupos PET da região sul, 2015, Londrina, Pages 37–40.

3) MATTOS, S. D. G., OLIVEIRA, V. M., SOARES, L. B., AGUIAR, Y. Q., MACIEL, B. K., Introdução à Robótica e Estímulo à Lógica de Programação no Ensino Básico Utilizando o Kit Educativo LEGO Mindstorms, IV Congresso Brasileiro de Informática na Educação e X Conferência Latino-Americana de Objetos e Tecnologias de Aprendizagem, 2015, Pages 1418–1424. DOI: 10.5753/cbie.wcbie.2015.1418

2) AGUIAR, Y. Q., CECOTTI, L., CAETANO, L., MARCOS, P. B., AZAMBUJA, J. R., Pré-Comp: introduzindo os fundamentos da Computação e contribuindo com a motivação e aproveitamento acadêmico, I Workshop de Ensino em Pensamento Computacional, Algoritmos e Programação, 2015, Pages 1340–1348. DOI: 10.5753/cbie.wcbie.2015.1340

1) STEFFENS, C.; SILVA FILHO, S.; LEONARDO, B.; AGUIAR, M.; BOTELHO, S. S. C.; ROSA, V.; AGUIAR, Y. Q., HUTTNER, V., A VBM System for Intelligent Robotic Welding, Simpósio Brasileiro de Automação Inteligente (SBAI), 2015, Pages 1242–1247.